- Product Description
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Overview：
MX300R The Series Of High-Temperature Reverse Deviation And Gate Deviation Test System Is A High-Temperature Voltage Stress Aging Test Equipment, Which Is Mainly Composed Of Heating, Temperature Control Unit, High And Low Voltage Sources And Related Control And Acquisition Units.
Features:
● The test accuracy is high, and the current range is automatically selected and divided according to the actual measured leakage current to ensure the test accuracy
● Real-Time Monitoring Of Test Temperature And Data, Test Channel Voltage/Station Leakage Current Detection/Test Chamber Temperature Detection And Depict A Complete Change Curve
● Independent High-Voltage Breakdown Protection, Each Station Protects The Device In Series To Prevent Damage To The Test Board Caused By Device Failure
● Compatible With Si/Sic/Gan Materials Igbt, Mosfet, Diode And Other Power Device Testing, The Device Form Is Compatible With Different Packages Such As Single Tube, Module, Etc.
Applications:
It is mainly used for voltage stress aging test of IGBT, SiC, diode and other power devices to evaluate the reliability of the device. Reference standard AQG324 automotive-grade power module reliability test standard, GJB128A semiconductor discrete device test method, AECQ101 discrete semiconductor application test certification specification based on failure mechanism, etc.
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Room B402, No. 100, Lane 4088, Luoshan Road, Beicai Town, Pudong New Area, Shanghai